Mr. Rommel Estores

Failure Analysis Engineer
ON Semiconductor
Failure Analysis
Oudenaarde Belgium 9700

Papers:

(V) Maximizing ATPG Diagnosis Resolution on Unique Single Failing Devices
(V) DIE LEVEL FAULT ISOLATION: Electro-Optical Probing for Capturing Fast-to-Rise Scan Chain Failures
(V) Pushing Failure Mode Stimulus to Overcome the Limitation/Boundaries of Soft Defect Localization Tools