Mr. EuiSeok KIM

Engineer
SK Hynix
Electrical Test & Analysis PJT
Icheon-si Korea, Republic of (South) 17336

Papers:

(V) Plasma FIB Delayering and Nanoprobe EBIRCH for Localizing DRAM Metal Short
(V) Pulsing test for defect of resistive word line in dram main cell using WGFMU (Waveform Generator Fast Measurement Unit)