Mr. Kuang Shien Lee

Senior FA
ON SEMICONDUCTOR
R&QA
South Portland, ME
USA 04106

Papers:

NANOPROBING, ELECTRICAL CHARACTERIZATION: P-N Junction Analysis using Electron Beam Induced Current (EBIC) Technique
DIE LEVEL FAULT ISOLATION: Creative approaches for thermal hot spot identification on analog IC
CASE STUDIES: FA PROCESSES - FA Approach in MIM (Metal-Insulator-Metal) Capacitor Failures