Mr. Rafael Lainez

Senior Manager
Samsung Austin Semiconductor, LLC
Analysis Engineering Group
Austin, TX
USA 78754

Papers:

(V) SCANNING PROBE ANALYSIS: Non-visual defect identification by dopant analysis method in FinFET devices
(V) SAMPLE PREPARATION AND DEVICE DEPROCESSING: Chip Recombination Method in Planar Deprocessing - A Solution for Failure Analysis on Chip Edge Defects