Prof. Myungsuk Kim

Corporate Vice President
samsung electronics
Flash PE
Hwaseong-si Korea, Republic of (South) 18448

Papers:

Machine Learning-Based Optimization Technique for High-Capacity V-NAND Flash Memory
Wafer Pattern Recognition for Detecting Process Abnormalities in NAND Flash Memory Manufacturing
PRODUCT YIELD, TEST & DIAGNOSTICS: Electrical Screening Method of VNAND Flash Channel Hole Bending Defects