Prof. Woo Young Choi

Professor
Kyungpook National University
Flash Product Engineering Team
Daegu Korea, Republic of (South) 41566

Papers:

Machine Learning-Based Optimization Technique for High-Capacity V-NAND Flash Memory
Wafer Pattern Recognition for Detecting Process Abnormalities in NAND Flash Memory Manufacturing
PRODUCT YIELD, TEST & DIAGNOSTICS: Electrical Screening Method of VNAND Flash Channel Hole Bending Defects