AI Applications for FA II

Tuesday, November 2, 2021: 1:15 PM-2:05 PM
104 ABC (Phoenix Convention Center)
Mr. Pascal Gounet, STMicroelectronics and Dr. Joy Liao, nVIDIA Corporation
1:15 PM
Machine Learning-Based Optimization Technique for High-Capacity V-NAND Flash Memory
Mr. Jisuk Kim, Samsung Electronics Co.; Mr. Earl Kim, Samsung Electronics Co.; Dr. Daehyeon Lee, Samsung Electronics Co.; Mr. Taeheon Lee, Samsung Electronics Co.; Prof. Myungsuk Kim, Kyungpook National University; Mr. Daesik Ham, Samsung Electronics Co.; Mrs. Miju Yang, Samsung Electronics Co.; Mr. Wanha Hwang, Samsung Electronics Co.; Mr. Jaeyoung Kim, Samsung Electronics Co.; Mr. Sangyong Yoon, Samsung Electronics Co.; Mr. Youngwook Jeong, Samsung Electronics Co.; Mrs. Eunkyoung Kim, Samsung Electronics Co.; Dr. Ki-Whan Song, Samsung Electronics Co.; Dr. Jai Hyuk Song, Samsung Electronics Co. Ltd.; Prof. Woo Young Choi, Sogang University
1:40 PM
(V) Using Ontologies in Failure Analysis
Ms. Anna Safont-Andreu, Infineon Tech. Austria AG; Mr. Christian Burmer, Infineon tech. AG; Dr. Konstantin Schekotihin, Universität Klagenfurt
See more of: Technical Program