FIB Circuit Analysis and Edit

Thursday, November 4, 2021: 9:50 AM-10:15 AM
104 ABC (Phoenix Convention Center)
* Advanced Ga-FIB CE tools and workflows
* Helium Ion Microscopy
* New gas chemistries
Dr. Daminda Dahanayaka, Globalfoundries and Mr. Antonio Tollis, Analog Devices
9:50 AM
Back Side Illumination Image Sensor Characterization by Backside Circuit Editing
Mr. Jian Yu, ON Semiconductor
See more of: Technical Program
<< Previous Session | Next Session >>