Product Yield, Test and Diagnostics

Tuesday, November 1, 2022: 4:10 PM-5:00 PM

Ballroom A (Pasadena Convention Center)

* Yield and Reliability Enhancement

* Metrology and In-line Device Characterization

* Diagnostic Testing, Scanning and Debug

Mr. Jayant D'Souza, Mentor and Mr. David Pivin, Intel

4:10 PM

Die Level Traceability as an Essential Tool in Failure Analysis and the Road to Zero Defects
Mr. Jon Carlo P. Salimbangon, onsemi; Mr. Rommel Estores, onsemi

4:35 PM

Optimization of annealing process conditions to reduce gate induced drain leakage current in Buried-Gate FETs.
Mr. Youmin KIM, Sungkyunkwan University; Mr. Donghbin kim, Sungkyunkwan University; Prof. Byoungdeok Choi, Sungkyunkwan University

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