A Failure Caused by Extended Cross-Defect in DRAM

Wednesday, November 15, 2023

Exhibit Hall | West 1 (Phoenix Convention Center)

Mr. Jaehoon Lee , samsung electronics, hwaseong-si, Korea, Republic of (South)

Mrs. Kim jinseon , samsung electronics, hwaseong-si, Korea, Republic of (South)

Mr. Dongguk Han , samsung electronics, hwaseong-si, Korea, Republic of (South)

Mr. seunghun Lee , samsung electronics, hwaseong-si, Korea, Republic of (South)

Dr. Sunwoo Kim , samsung electronics, hwaseong-si, Korea, Republic of (South)

Mrs. Jingyeong Seol , samsung electronics, hwaseong-si, Korea, Republic of (South)

Mr. Seungjin Lee , samsung electronics, hwaseong-si, Korea, Republic of (South)

Mr. Kyoungrak Cho , samsung electronics, hwaseong-si, Korea, Republic of (South)

Dr. Nam incheol , samsung electronics, hwaseong-si, Korea, Republic of (South)

Mr. Daesun Kim , samsung electronics, hwaseong-si, Korea, Republic of (South)

Mr. Beomseop Lee , samsung electronics, hwaseong-si, Korea, Republic of (South)

Mr. Heeil Hong , samsung electronics, hwaseong-si, Korea, Republic of (South)

Mr. Sangjun Hwang , samsung electronics, hwaseong-si, Korea, Republic of (South)