Backside Fault Localization and defect physical analysis of degraded power HEMT p-GaN transistors stressed in DC and AC modes.

Monday, November 13, 2023: 1:40 PM

103 A-B (Phoenix Convention Center)

Mr. Lucien Ghizzo , THALES SIX France SAS, Labège, Occitanie, France, LAAS-CNRS, Toulouse, Occitanie, France, LAPLACE, Toulouse, Occitanie, France

Dr. Gérald Guibaud , THALES SIX France SAS, Labège, Occitanie, France

Mr. François Jamin , THALES SIX France SAS, Labège, Occitanie, France

Mrs. Vanessa Chazal , THALES SIX France SAS, Labège, Occitanie, France

Dr. David Trémouilles , LAAS-CNRS, Toulouse, Occitanie, France

Dr. Richard Monflier , LAAS-CNRS, Toulouse, Occitanie, France

Dr. Frédéric Richardeau , LAPLACE, Toulouse, Occitanie, France

Dr. Guillaume Bascoul , Centre National d'Etudes Spatiales (CNES), Toulouse, France

Dr. Manuel Gonzáles Sentís , Centre National d'Etudes Spatiales (CNES), Toulouse, France

Dr. Christophe De Nardi , THALES SIX France SAS, Labège, Occitanie, France