Electrical Fault Isolation of Stuck at Reset Hard Failures

Tuesday, November 14, 2023: 10:10 AM
103 A-B (Phoenix Convention Center)
Ms. Amrutha Sampath , NXP Semiconductors, Austin, TX
Mr. Kristofor Dickson , NXP Semiconductors, Austin, TX
Mr. Carey Wu , NXP Semiconductors, Austin, TX

Summary:

This paper explains the complexity of Stuck at Reset Hard failures and provides innovative approaches to debug such failures. This methodology to debug complex functional stuck at reset failures is illustrated through case studies in this paper.