Cell-Aware test integration towards achieving 0 DPPB on automotive designs

Thursday, November 16, 2023: 9:40 AM
104 A-B (Phoenix Convention Center)
Mr. Saidapet Ramesh , NXP Semiconductors, Austin, TX
Mrs. Nikila Krishnamurthy , NXP Semiconductors, Noida, Uttar Pradesh, India
Mr. Siddharth Jha , NXP Semiconductors, Noida, Uttar Pradesh, India
Mr. Jun Keat Loh , NXP Semiconductors, Kuala Lumpur, Selangor, Malaysia
Mrs. CP Ling , NXP Semiconductors, Kuala Lumpur, Selangor, Malaysia
Dr. Gary Clark , NXP Semiconductors, Austin, TX

See more of: Product Yield, Test, and Diagnostics
See more of: Technical Program