Product Yield, Test, and Diagnostics

Thursday, November 16, 2023: 9:20 AM-10:00 AM
104 A-B (Phoenix Convention Center)
Mr. Jayant D'Souza, Siemens and Dr. Shraddha Bodhe, Advanced Micro Devices Ptd Ltd
9:20 AM
Detection and localization of undesired quasi-static transitions in a scan flip-flop
Mr. Angelo Antonio Merassi, STMicroelectronics; Mrs. Patrizia Sacchi, STMicroelectronics; Mr. Andrea Jossa, STMicroelectronics; Mr. Marcello Raimondi, STMicroelectronics; Mr. Stefano Frascolla, STMicroelectronics
9:40 AM
Cell-Aware test integration towards achieving 0 DPPB on automotive designs
Mr. Saidapet Ramesh, NXP Semiconductors; Mrs. Nikila Krishnamurthy, NXP Semiconductors; Mr. Siddharth Jha, NXP Semiconductors; Mr. Jun Keat Loh, NXP Semiconductors; Mrs. CP Ling, NXP Semiconductors; Dr. Gary Clark, NXP Semiconductors
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