49th International Symposium for Testing and Failure Analysis (Nov. 12 – Nov. 16, 2023)
November 12 - 16, 2023
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Enhancing Device Margins Using Double-Gate Oxide in Buried-Gat FETs
Tuesday, November 14, 2023: 11:30 AM
103 A-B (Phoenix Convention Center)
Mr. Youmin KIM
,
Sungkyunkwan University, Suwon, Korea, Republic of (South)
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