A comprehensive Failure Analysis Approach Utilizing High Resolution Targeted Patterns (HRTP) for ATPG Diagnosis Resolution Improvement, Test Coverage Resolution, and Further Fault Localization
A comprehensive Failure Analysis Approach Utilizing High Resolution Targeted Patterns (HRTP) for ATPG Diagnosis Resolution Improvement, Test Coverage Resolution, and Further Fault Localization
Tuesday, November 14, 2023: 10:30 AM
103 A-B (Phoenix Convention Center)
Summary:
Abstract: This paper discusses a comprehensive failure analysis approach to digital failures. High Resolution Targeted Patterns (HRTP) is highlighted along with its advantages in failure analysis by aiding in ATPG diagnoses resolution improvement, increase chance of detecting fault not detected by patterns implemented on ATE, determine a potential test screen, provide stimulus for further fault localization, and increase the analysis success rate. This comprehensive approach and the use of HRTP are proven very helpful in analysis of internal, and more so, of customer returns. Three cases will be discussed in this paper to highlight these advantages.
Abstract: This paper discusses a comprehensive failure analysis approach to digital failures. High Resolution Targeted Patterns (HRTP) is highlighted along with its advantages in failure analysis by aiding in ATPG diagnoses resolution improvement, increase chance of detecting fault not detected by patterns implemented on ATE, determine a potential test screen, provide stimulus for further fault localization, and increase the analysis success rate. This comprehensive approach and the use of HRTP are proven very helpful in analysis of internal, and more so, of customer returns. Three cases will be discussed in this paper to highlight these advantages.