Advances in high-resolution non-destructive defect localization based on Machine Learning enhanced signal processing

Tuesday, November 14, 2023: 10:10 AM
104 A-B (Phoenix Convention Center)
Dr. Sebastian Brand , Fraunhofer Institute for Microstructure of Materials and Systems, Halle, Germany
Mr. Michael Koegel , Fraunhofer IMWS, Halle, Germany
Mr. Christian Grosse , Fraunhofer Institute for Microstructure, Halle, Germany
Mr. Frank Altmann , Fraunhofer Institute for Microstructure of Materials and Systems, Halle, Germany
Dr. Christian Hollerith , Infineon Technologies AG, Neubiberg, Germany
Mr. Pascal Gounet , STMicroelectronics, Grenoble, France

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