Fault Simulation for Dynamic Failures in Analog and Mixed Signal Circuits
Fault Simulation for Dynamic Failures in Analog and Mixed Signal Circuits
Monday, November 13, 2023: 10:40 AM
301A (Phoenix Convention Center)
Summary:
The localization of defects that cause dynamic electrical behavior is a constant challenge for failure analysts. Such types of failures are often present in analog circuits, and standard fault isolation techniques are constrained and not always successful. In this paper, we expose a method to exploit industrial fault simulators in conjunction with standard analysis methods to solve analyses in analog circuits. In addition, we explore some commands to adapt fault simulation to these dynamic electrical failure modes. The method is presented on results of real-world failure analyses of oscillators.
The localization of defects that cause dynamic electrical behavior is a constant challenge for failure analysts. Such types of failures are often present in analog circuits, and standard fault isolation techniques are constrained and not always successful. In this paper, we expose a method to exploit industrial fault simulators in conjunction with standard analysis methods to solve analyses in analog circuits. In addition, we explore some commands to adapt fault simulation to these dynamic electrical failure modes. The method is presented on results of real-world failure analyses of oscillators.