Emerging FA Techniques and Concepts

Monday, November 13, 2023: 10:20 AM-11:00 AM
301A (Phoenix Convention Center)
Dr. Baohua Niu, TSMC Technology Inc., and Mr. Kah Chin Cheong, Samsung Austing Semiconductor LLC.
10:20 AM
On Demand Bit-Level SRAM Validation using CW 785nm Laser-Induced Fault Analysis (LIFA)
Dr. Keith Serrels, NXP Semiconductors; Mr. Kristofor Dickson, NXP Semiconductors; Mr. Clifford Howard, NXP Semiconductors; Mr. Jose Z. Garcia, NXP Semiconductors; Mr. Eric Foote, NXP Semiconductors; Dr. Gary Clark, NXP Semiconductors; Mr. Ben Gonzalez, NXP Semiconductors; Ms. Chinemerem Nwokolo, NXP Semiconductors
10:40 AM
Fault Simulation for Dynamic Failures in Analog and Mixed Signal Circuits
Dr. Tommaso Melis, STMicroelectronics
11:00 AM
Break
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