Inline Defect Solution to Mitigate EOL Device Failures
Inline Defect Solution to Mitigate EOL Device Failures
Tuesday, November 14, 2023: 12:50 PM
104 A-B (Phoenix Convention Center)
Summary:
In order to mitigate and prevent EOL device failure, a case study is presented to demonstrate a new procedure called defect root cause analysis for IC HVM to solve inline defect issues.
In order to mitigate and prevent EOL device failure, a case study is presented to demonstrate a new procedure called defect root cause analysis for IC HVM to solve inline defect issues.