49th International Symposium for Testing and Failure Analysis (Nov. 12 – Nov. 16, 2023)
November 12 - 16, 2023
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Low-kV FIB applications and workflows for advanced circuit edit
Monday, November 13, 2023: 11:30 AM
104 A-B (Phoenix Convention Center)
Dr. Rongjin Yan
,
Broadcom, Fort Collins, CO
Dr. Alex Buxbaum
,
Thermo Fisher Scientific, Fremont, CA
Dr. Majid Vaghayenegar
,
Thermo Fisher Scientific, Fremont, CA
Dr. David Donnet
,
Thermo Fisher Scientific, Fremont, CA
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FIB Circuit Analysis and Edit
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Technical Program