Complete Compressed Sensing System For Scanning Probe Microscopy
Complete Compressed Sensing System For Scanning Probe Microscopy
Thursday, November 16, 2023: 9:40 AM
103 A-B (Phoenix Convention Center)
Summary:
An approach to overcome barriers to practical Compressed Sensing (CS) implementation in serial scanning electron microscopes (SEM) or scanning transmission electron microscopes (STEM) is presented which integrates scan generator hardware specifically developed for CS, a novel and generalized CS sparse sampling strategy, and an ultra-fast reconstruction method, to form a complete CS system for electron microscopy.
An approach to overcome barriers to practical Compressed Sensing (CS) implementation in serial scanning electron microscopes (SEM) or scanning transmission electron microscopes (STEM) is presented which integrates scan generator hardware specifically developed for CS, a novel and generalized CS sparse sampling strategy, and an ultra-fast reconstruction method, to form a complete CS system for electron microscopy.