Voltage Free Failure Analysis of Sub-15nm DRAM Gate Insulator Breakdown based on  Thermal Laser Stimulation

Wednesday, November 15, 2023

Exhibit Hall | West 1 (Phoenix Convention Center)

Ms. Chae Soo Kim , Samsung Electronics, Pyungtaek-si, Gyeonggi-do, Korea, Republic of (South)

Ms. Bohyeon Jeon , Samsung Electronics, Pyungtaek-si, Gyeonggi-do, Korea, Republic of (South)

Mr. Chiheon Byeon , Samsung Electronics, Pyungtaek-si, Gyeonggi-do, Korea, Republic of (South)

Mr. Seungchul Yew , Samsung Electronics, Pyungtaek-si, Gyeonggi-do, Korea, Republic of (South)

Mr. Dongin Lee , Samsung Electronics, Pyungtaek-si, Gyeonggi-do, Korea, Republic of (South)

Mr. Seguen Park , Samsung Electronics, Pyungtaek-si, Gyeonggi-do, Korea, Republic of (South)

Mr. Hyodong Ban , Samsung Electronics, Pyungtaek-si, Gyeonggi-do, Korea, Republic of (South)