Nanoprobing and Electrical Characterization I
Thursday, November 16, 2023: 1:30 PM-2:10 PM
103 A-B (Phoenix Convention Center)
Mr. David Albert, IBM (Retired) and Mr. John Sanders, Thermofisher
1:30 PM
Multilayer pFIB Trenches for Multiple Tip EBAC/EBIRCH Analysis and Internal Node Transistor Characterization
Mr. Nicholas Pronin, NXP Semiconductors;
Dr. Stefano Larentis, NXP Semiconductors;
Mr. Carey Wu, NXP Semiconductors;
Mr. Eric Foote, NXP Semiconductors;
Dr. Gary Clark, NXP Semiconductors;
Mrs. Khiem Ly, NXP Semiconductors;
Mr. Jacob Levenson, NXP Semiconductors;
Mr. Kristofor Dickson, NXP Semiconductors;
Mr. Charles Petri, NXP Semiconductors;
Mr. Nelson Gomez, NXP Semiconductors;
Mr. Tony Chrastecky, NXP Semiconductors
