Case Studies: FA Process and workflows

Tuesday, October 29, 2024: 1:20 PM-2:50 PM
204 (Hilton San Diego Bayfront)
Mr. Kah Chin Cheong, Samsung and Narang Vinod, Advanced Micro Devices Pte Ltd
1:20 PM
Integrating Multimodal Microscopy and Artificial Intelligence Solutions for Laser Dicing Process Induced Defect Identification
Dr. Flavio Cognigni, Carl Zeiss SpA; Dr. Domenico Mello, EM Microelectronic, a Company of the Swatch Group; Dr. Heiko Stegmann, Carl Zeiss Microscopy GmbH; Dr. Anton du Plessis, Comet Technologies Canada Inc.; Dr. Guillaume Fiannaca, EM Microelectronic, a Company of the Swatch Group; Dr. Philippe Von Gunten, EM Microelectronic, a Company of the Swatch Group; Prof. Marco Rossi, Sapienza University of Rome; Dr. Giulio Lamedica, Carl Zeiss SpA
1:40 PM
High Contact Resistance from Preferential Oxidation of Silane Gas
Dr. Wentao Qin, Microchip Technologies Inc.; Mr. Esteban Ortiz, Microchip Technologies Inc.; Mr. Brandon Lent, Microchip Tempe; Mr. Tim McGrady, Microchip Co; Ms. Golnaz Yousefi, Microchip; Dr. Randy Yach, Microchip Technologies Inc.; Mr. Avik Chunder, Microchip Or; Ms. Denise Barrientos, Microchip Technologies Inc.; Mr. Manny Espinosa, Microchip Technologies Inc.; Mr. Al Merino, Microchip Technologies Inc.; Ms. Christine Janasky, Microchip Technologies Inc.; Ms. Tina Ruiz-Cook, Microchip Co; Mr. Andy Blemker, Microchip Co
2:00 PM
2:20 PM
EBIC at Cross-Section
Dr. Yuyan Wang, Texas Instruments
See more of: Technical Program