High-Precision Fault Localization in LSI Using Photo Emission Microscopy with Logical State Consideration
High-Precision Fault Localization in LSI Using Photo Emission Microscopy with Logical State Consideration
Tuesday, November 18, 2025: 10:50 AM
3 (Pasadena Convention Center)
Summary:
To improve the success rate of FA, it is important to refine electrical troubleshooting processes. However, EFI techniques face serious challenges with excessive power consumption. This current can disrupt EFI operations. For example, it could cause switching delays due to internal IR drops, leading to unexpected malfunctions in logic operations. Moreover, it may damage the device. To mitigate this issue, minimizing the amount of switching activity during tests is a widely adopted measure to reduce power consumption. However, when the switching activity is reduced, the total test time becomes longer, and so does the looping period for EFI. This weakens every EFI detection signal, causing the 2D location image to be less clear. To address this problem, a PEM with halting at failing logic state was studied, which will not cause excessive switching current. This static PEM method proved effective, offering more accurate localization than conventional dynamic EFI techniques.
To improve the success rate of FA, it is important to refine electrical troubleshooting processes. However, EFI techniques face serious challenges with excessive power consumption. This current can disrupt EFI operations. For example, it could cause switching delays due to internal IR drops, leading to unexpected malfunctions in logic operations. Moreover, it may damage the device. To mitigate this issue, minimizing the amount of switching activity during tests is a widely adopted measure to reduce power consumption. However, when the switching activity is reduced, the total test time becomes longer, and so does the looping period for EFI. This weakens every EFI detection signal, causing the 2D location image to be less clear. To address this problem, a PEM with halting at failing logic state was studied, which will not cause excessive switching current. This static PEM method proved effective, offering more accurate localization than conventional dynamic EFI techniques.