51st International Symposium for Testing and Failure Analysis (November 16-20, 2025)
November 16 - 20, 2025
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Tutorial: Defect localization by Lock-In-Thermography
Sunday, November 16, 2025: 11:20 AM
2 (Pasadena Convention Center)
Dr. Sebastian Brand
,
Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Halle, Saxony-Anhalt, Germany
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Fault Isolation - Lock-in Thermography
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Tutorial