Fault Isolation - Lock-in Thermography

Sunday, November 16, 2025: 11:20 AM-12:20 PM

Ballroom C (Pasadena Convention Center)

Dr. Mike Bruce, Independant

11:20 AM

Tutorial: Defect localization by Lock-In-Thermography
Dr. Sebastian Brand, Fraunhofer Institute for Microstructure of Materials and Systems IMWS

See more of: Tutorial