Scanning Electron Microscopy for Advanced Semiconductor Packaging: From Sample Preparation to Characterization and Failure Analysis

Sunday, November 16, 2025: 1:30 PM
Ballroom A (Pasadena Convention Center)
Dr. Pawel Nowakowski , E.A. Fischione Instruments, Inc., Export, PA

See more of: Microscopy - SEM Sample Prep
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