Microscopy - SEM Sample Prep

Sunday, November 16, 2025: 1:30 PM-2:30 PM
3 (Pasadena Convention Center)
1:30 PM
Scanning Electron Microscopy for Advanced Semiconductor Packaging: From Sample Preparation to Characterization and Failure Analysis
Dr. Pawel Nowakowski, E.A. Fischione Instruments, Inc.
See more of: Tutorial
<< Previous Session | Next Session >>