Uniform, Large-Area Delayering for Microelectronic Device Analysis: A Scalable Approach for Industrial Failure Analysis and Reverse Engineering

Thursday, November 20, 2025: 12:50 PM
2 (Pasadena Convention Center)
Dr. Pawel Nowakowski , E.A. Fischione Instruments, Inc., Export, PA
Dr. Richard Wei-Chih Li , E.A. Fischione Instruments, Inc., Export, PA
Ms. Mary Ray , E.A. Fischione Instruments, Inc., Export, PA
Mr. Paul Fischione , E.A. Fischione Instruments, Inc., Export, PA

See more of: Sample Preparation and Device De-processing II
See more of: Technical Program