Detection Efficiency Improvements on Automated Soft Defect Localization Using Array-based Image Reconstruction

Thursday, November 20, 2025: 10:00 AM
1 (Pasadena Convention Center)
Mr. Benny Hsu , Advanced Micro Devices, Inc., Austin, TX
Mr. Arun Karunanithi , Advanced Micro Devices, Inc., Austin, TX
Mr. Kent Erington , Advanced Micro Devices, Inc., Austin, TX
Mr. Calder Wilson , Advanced Micro Devices, Inc., Austin, TX

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