Automation of Electron Channeling Contrast Imaging: Investigation of dislocations in AlGaN/GaN heterostructures

Wednesday, November 19, 2025: 8:40 AM
2 (Pasadena Convention Center)
Mr. Alexander Roch , Infineon Technologies AG, Neubiberg, Germany
Dr. Christian Hollerith , Infineon Technologies AG, Neubiberg, Germany
Dr. Nicole Killat , Infineon Technologies AG, Neubiberg, Germany
Dr. Frank Siegelin , Infineon Technologies AG, Neubiberg, Germany
Dr. Claire Chisholm , KAI Kompetenzzentrum Automobil- und Industrieelektronik GmbH, Villach, Austria
Mr. Alexander Hofer , Infineon Technologies Austria AG, Villach, Austria
Prof. Antoine Guitton , Université de Lorraine, Metz, France
Ms. Karen Geens , IMEC Interuniversity Microelectronics Centre, Leuven, Belgium
Mr. Jawad Hadid , IMEC Interuniversity Microelectronics Centre, Leuven, Belgium
Mr. Anurag Vohra , IMEC Interuniversity Microelectronics Centre, Leuven, Belgium
Prof. Matthias Gramich , University of Applied Sciences, Munich, Germany