Optimized Ga FIB Lift-Out and Ar Ion Beam Milling for High-Quality STEM-EBIC TEM Specimens

Monday, November 17, 2025: 3:00 PM

1 (Pasadena Convention Center)

Dr. Cecile S. Bonifacio , E.A. Fischione Instruments, Inc., Export, PA

Dr. William Hubbard, PhD , NanoElectronic Imaging, Inc., Riverside, CA

Dr. Richard Wei-chi Li , E.A. Fischione Instruments, Inc., Export, PA

Ms. Mary Ray , E.A. Fischione Instruments, Inc., Export, PA

Mr. Paul Fischione , E.A. Fischione Instruments, Inc., Export, PA