Optimized Ga FIB Lift-Out and Ar Ion Beam Milling for High-Quality STEM-EBIC TEM Specimens

Monday, November 17, 2025: 3:00 PM
Ballroom A (Pasadena Convention Center)
Dr. Cecile S. Bonifacio , Fischione Instruments, Export, PA
Dr. William Hubbard, PhD , NanoElectronic Imaging, Inc., Riverside, CA
Dr. Richard Wei-chi Li , E.A. Fischione Instruments, Inc., Export, PA
Ms. Mary Ray , E.A. Fischione Instruments, Inc., Export, PA
Mr. Paul Fischione , E.A. Fischione Instruments, Inc., Export, PA

See more of: FIB Sample Preparation IV
See more of: Technical Program