Analysis and Characterization of Intermittent Gate Leakage  in a FinFET SRAM

Tuesday, November 18, 2025: 4:00 PM

3 (Pasadena Convention Center)

Mr. Greg Hornicek , IBM, Hopewell Junction, NY

David Albert , IBM (Supplemental), Hopewell Junction, NY

Mr. Michael Tenney , IBM, Hopewell Junction, NY

Mr. Stephen Wu , IBM, Hopewell Junction, NY

Mr. Malik Ali , IBM, Hopewell Junction, NY, IBM, Hopewell Junction, NY