Analysis and Characterization of Intermittent Gate Leakage in a FinFET SRAM

Tuesday, November 18, 2025: 3:40 PM
Ballroom B (Pasadena Convention Center)
Mr. Greg Hornicek , IBM, Hopewell Junction, NY
David Albert , IBM (Supplemental), Hopewell Junction, NY
Mr. Michael Tenney , IBM, Hopewell Junction, NY
Mr. Stephen Wu , IBM, Hopewell Junction, NY
Mr. Malik Ali , IBM, Hopewell Junction, NY, IBM, Hopewell Junction, NY

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