Correlative In-Situ AFM-in-SEM technique for Advanced Semiconductor Failure Analysis and Material Characterization

Sunday, November 16, 2025: 3:50 PM

3 (Pasadena Convention Center)

Dr. Jan Neuman , NenoVision s. r. o., Brno, Jihomoravsky kraj, Czech Republic

Mr. Ondřej Novotný , NenoVision s. r. o., Brno, Jihomoravsky kraj, Czech Republic

Mrs. Veronika Hegrová , NenoVision s. r. o., Brno, Jihomoravsky kraj, Czech Republic

Mr. Lukáš Kormoš , Thermo Fisher Scientific, Brno, Czech Republic, Thermo Fisher Scientific, Brno, Jihomoravský kraj, Czech Republic

Mr. Libor Strakoš , Thermo Fisher Scientific, Brno, Jihomoravský kraj, Czech Republic

Dr. Claudiu Colbea , Thermo Fisher Scientific, Brno, Jihomoravský kraj, Czech Republic

Mr. Md Ashiqur Rahman Laskar , Arizona State University, Tempe, AZ

Prof. Umberto Celano , Arizona State University, Tempe, AZ

Rosalinda Ring , NenoVision s. r. o., Brno, Jihomoravsky kraj, Czech Republic

See more of: Microscopy - AFM in SEM
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