Correlative In-Situ AFM-in-SEM technique for Advanced Semiconductor Failure Analysis and Material Characterization Dr. Jan Neuman, NenoVision s. r. o.;
Mr. Ondřej Novotný, NenoVision s. r. o.;
Mrs. Veronika Hegrová, NenoVision s. r. o.;
Mr. Lukáš Kormoš, Thermo Fisher Scientific;
Mr. Libor Strakoš, Thermo Fisher Scientific;
Dr. Claudiu Colbea, Thermo Fisher Scientific;
Mr. Md Ashiqur Rahman Laskar, Arizona State University;
Prof. Umberto Celano, Arizona State University;
Rosalinda Ring, NenoVision s. r. o.
