51st International Symposium for Testing and Failure Analysis (November 16-20, 2025): Sample Preparation and Device De-processing - Mechanical Sample Preparation of Heterogenous Devices - Understanding the Impact of Chiplet Stresses Through a Process of Elimination

Sample Preparation and Device De-processing - Mechanical Sample Preparation of Heterogenous Devices - Understanding the Impact of Chiplet Stresses Through a Process of Elimination

Wednesday, November 19, 2025

Mr. Chris Richardson , Allied High Tech Products, Inc., Edmond, OK

Mr. Skylar Fox , Allied High Tech Products, Inc., Edmond, OK

See more of: Poster Session
See more of: Poster Session