Sample Preparation and Device De-processing I

Thursday, November 20, 2025: 10:00 AM-11:00 AM
2 (Pasadena Convention Center)
Ms. Rose Ring, NenoVision s. r. o. and Dr. Zachary Lingley, Infineon Technologies AG
10:00 AM
Strategic Domain Isolation using FIB to Overcome Nanoprobing Constraints on Challenging Samples
Dr. S. L. Ting, Globalfoundries Singapore Pte Ltd.; Mr. P. K. Tan, Globalfoundries Singapore Pte Ltd.; Mr. P.T. Ng, Globalfoundries Singapore Pte Ltd.; Dr. A.C.T. Quah, Globalfoundries Singapore Pte Ltd.; Dr. C.Q. Chen, Globalfoundries Singapore Pte Ltd.
10:20 AM
Backside Decapsulation of Small Outline Transistor (SOT) Packages Through Milling Techniques
Mr. John Michael H. Saputil, Analog Devices; Mr. Edgardo Q. Bilog, Analog Devices
10:40 AM
Cathode Lens Alignment for Damage-free Automated Device Delayering Process with Low-Energy Electron Beam
Dr. Claudiu Colbea, Thermo Fisher Scientific; Ms. Tereza Hurník Konečná, Thermo Fisher Scientific; Mr. Dominik Ficek, Thermo Fisher Scientific; Dr. Marek Unčovský, Thermo Fisher Scientific; Dr. Adam Stokes, Thermo Fisher Scientific; Ms. Melissa Mullen, Thermo Fisher Scientific
11:00 AM
Sample Preparation and Device De-processing - Mechanical Sample Preparation of Heterogenous Devices - Evaluating SOC Chip Relaxation When Removing Chiplets
Mr. Chris Richardson, Allied High Tech Products, Inc.; Mr. Skylar Fox, Allied High Tech Products, Inc.
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