Case Study: Nanoprobe Verification of EOS Induced Resistor-Capacitor Oscillator Frequency Shift Failure
Case Study: Nanoprobe Verification of EOS Induced Resistor-Capacitor Oscillator Frequency Shift Failure
Tuesday, November 18, 2025: 1:50 PM
2 (Pasadena Convention Center)
Summary:
This paper will demonstrate how an unexpected standard deprocessing result first indicated EOS as a possible root cause of the oscillator frequency shift failure even though the leakage tests did not indicate an EOS issue. It will then be shown how nanoprobe analysis of the oscillator circuit was able to confirm that EOS was the primary failure mechanism. Confirmation and corrective action by the customer eliminating the EOS problem confirmed the analysis results as true.
This paper will demonstrate how an unexpected standard deprocessing result first indicated EOS as a possible root cause of the oscillator frequency shift failure even though the leakage tests did not indicate an EOS issue. It will then be shown how nanoprobe analysis of the oscillator circuit was able to confirm that EOS was the primary failure mechanism. Confirmation and corrective action by the customer eliminating the EOS problem confirmed the analysis results as true.