Mr. Paul Fischione

CEO
E.A. Fischione Instruments, Inc.
Export, PA
USA 15632

Papers:

Uniform, Large-Area Delayering for Microelectronic Device Analysis: A Scalable Approach for Industrial Failure Analysis and Reverse Engineering
Optimized Ga FIB Lift-Out and Ar Ion Beam Milling for High-Quality STEM-EBIC TEM Specimens