51st International Symposium for Testing and Failure Analysis (November 16-20, 2025)
November 16 - 20, 2025
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Ms. Rose Ring
Team Section Leader
Thermo Fisher Scientific
Malibu, CA
USA 94538
Papers:
Streamlined Advanced Semiconductor FA Through In-Situ CAFM and Plasma FIB Integration
Correlative In-Situ AFM-in-SEM technique for Advanced Semiconductor Failure Analysis and Material Characterization