Mr. Dongin Lee

Process Integration, Engineer
Samsung Electronics
Memory division
Pyungtaek-si, Gyeonggi-do
Korea, Republic of (South) 17786

Papers:

FA Process: Fault Isolation, Mechanisms, & Solutions - Stress-Optimized Screening for Reliability-Critical BCAT Disconnections in Advanced DRAM
Accelerated Prediction and Spatial Profiling of HEIP Degradation for Layout-Driven Reliability Analysis