51st International Symposium for Testing and Failure Analysis (November 16-20, 2025): https://www.asminternational.org/istfa-2025/

51st International Symposium for Testing and Failure Analysis (November 16-20, 2025)
November 16 - 20, 2025

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Dr. Domenico Mello

CTM Physics Lab. Manager
EM Microelectronic, a Company of the Swatch Group
Marin-Epagnier, Catania
Switzerland 2074

Papers:

Advanced method for 3D FIB tomography AI supported on SRAM I/O circuit block with missing data bits problems
First and Preliminary Approach at the Usage of FIB ToF for Borophosphilicate Layer Characterization Directly on Device Failing Structures

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General Information

November 16 - 20, 2025


Pasadena, CA