Dr. Pawel Nowakowski

Scientist
E.A. Fischione Instruments, Inc.
Export, PA
USA 15632

Papers:

Scanning Electron Microscopy for Advanced Semiconductor Packaging: From Sample Preparation to Characterization and Failure Analysis
Uniform, Large-Area Delayering for Microelectronic Device Analysis: A Scalable Approach for Industrial Failure Analysis and Reverse Engineering