Ms. Hyun Hwa Kim

Applications Development Engineer
Carl Zeiss Microscopy
Electronics Sector
Oberkochen, Oberkochen
Germany

Papers:

Microscopy Analysis and Material Characterization - ECCI imaging of epitaxial GaN with conventional FE-SEM
Power Devices (Si, SiC, GaN) - Investigation of early photon emission (PEM) in GaN-on-Si HEMTs, part I
Low impact analysis of junctions in power devices