Emerging FA Techniques and Concepts I

Monday, November 17, 2025: 10:20 AM-11:00 AM
3 (Pasadena Convention Center)
Mr. Kent Erington, Advanced Micro Devices, Inc. and Dr. Mike Bruce, Independant
10:20 AM
Electrically Active Defect Localization using X-ray-Induced Volatge Alteration (XrIVA)
Dr. Andrea L. Rodarte, Sandia National Laboratories; Mr. Joel Long, Model World LLC; Dr. Edward I. Cole Jr., FASM, Sandia National Laboratories
10:40 AM
Performance of a 3D Magnetic Inverse for Fault Localization
Dr. Frederick C. Wellstood, Quantum Materials Center; Neocera MAGMA LLC; Mr. Nesco Lettsome, Neocera MAGMA LLC; Mr. J Patel, Neocera MAGMA LLC; Ms. J Sabath, Neocera MAGMA LLC; Dr. A. B. Cawthorne, Trevecca Nazarene University, Neocera MAGMA LLC; Dr. T Venkatesan, FRS, Center of Optimal Materials for Emerging Technologies (COMET), Neocera MAGMA LLC
See more of: Technical Program
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