Tech. Specific & Featured - Intro to FIB

Sunday, November 16, 2025: 11:20 AM-12:20 PM

Ballroom B (Pasadena Convention Center)

Jason Holm, PhD, National Institute of Standards and Technology and Dr. William Hubbard, PhD, NanoElectronic Imaging, Inc.

11:20 AM

An Introduction to the FIB (Focused Ion Beam) as a Microchip Circuit Edit Tool
Mr. Steven Herschbein, EDFAS; Dr. Shida Tan, Natcast; Mr. Richard H. Livengood, Si-Fi Consulting, LLC; Mr. Michael Wong, ThermoFisher Scientific

See more of: Tutorial