FIB Sample Preparation II
Monday, November 17, 2025: 11:30 AM-12:10 PM
1 (Pasadena Convention Center)
11:30 AM
Advancement Towards FIB Active Auto Thinning (AAT) Process
Dr. Sang Hoon Lee, PhD, Micron Technology;
Dr. Xue Rui, PhD, Micron Technology;
Dr. Ning Lu, PhD, Micron Technology;
Mr. John Pittman, Micron Technology;
Dr. Qiang Jin, PhD, Micron Technology;
Mr. Joel Lebret, Micron Technology;
Mr. Robert Gifford, Micron Technology;
Mr. Tyler Lenzi, Micron Technology;
Mr. Jaroslav Stárek, Thermo Fisher Scientific;
Mr. Viktor Švéda, Thermo Fisher Scientific;
Mr. Lukáš Hübner, Thermo Fisher Scientific;
Mr. Jakub Korgo, Thermo Fisher Scientific;
Dr. Zhen Lian, PhD, Thermo Fisher Scientific;
Mr. Gabriel Woodworth, Thermo Fisher Scientific;
Mr. Davin Fast, Thermo Fisher Scientific;
Ms. Anne Kenslea, Thermo Fisher Scientific
11:50 AM
Automated Full Wafer FIB Marking – A Smart Way to Improve Overall FA Efficiency and Reduce Human Errors
Mr. Kah Chin Cheong, Samsung Austin Semiconductor, LLC;
Dr. Michael Rodder, Samsung Austin Semiconductor, LLC;
Mr. Binh Vi Ngu, Samsung Austin Semiconductor, LLC;
Mr. Gregory B Collins, Samsung Austin Semiconductor, LLC;
Mr. Christopher Penley, Samsung Austin Semiconductor, LLC;
Mr. Rafael Lainez, Samsung Austin Semiconductor, LLC
