Scanning Probe Analysis

Monday, November 17, 2025: 11:30 AM-12:10 PM

2 (Pasadena Convention Center)

Mr. Phil Kaszuba, Globalfoundries and Mr. Daminda Dahanayaka, IBM STD/MD

11:30 AM

Advancing Semiconductor Characterization: Utilizing 3D Reconstruction Techniques with AFM Electrical Modes
Mr. Kyle M. Winter, Eng., State University of New York at New Paltz; Dr. Ping-Chuan Wang, Eng.Sc.D., State University of New York at New Paltz; Mr. Oliver Trzcinski, State University of New York at New Paltz

11:50 AM

Streamlined Advanced Semiconductor FA Through In-Situ CAFM and Plasma FIB Integration
Dr. Chuan Zhang, NVIDIA Corporation; Dr. Jane Y. Li, NVIDIA Corporation; Mr. Radek Dao, NenoVision s. r. o.; Ms. Rose Ring, NenoVision s. r. o.

See more of: Technical Program