Scanning Probe Analysis

Monday, November 17, 2025: 11:20 AM-12:00 PM

Ballroom B (Pasadena Convention Center)

Mr. Phil Kaszuba, Globalfoundries and Mr. Daminda Dahanayaka, IBM STD/MD

11:20 AM

Streamlined Advanced Semiconductor FA Through In-Situ CAFM and Plasma FIB Integration
Dr. Chuan Zhang, NVIDIA Corporation; Dr. Jane Y. Li, NVIDIA Corporation; Mr. Radek Dao, NenoVision s. r. o.; Ms. Rose Ring, NenoVision s. r. o.

See more of: Technical Program